Author:
Malvezzi A.M.,Kurz H.,Bloembergen N.
Abstract
ABSTRACTFour different regimes of photoelectric emission are observed over a vide
fluence range of UV-laser pulses irradiating single-crystal silicon samples.
The role of the electron-hole plasma in the nonlinear photoemission is
demonstrated by temporal correlation measurements. A regime where ion
thermal evaporation processes take place is observed above the critical
fluence for melting. At higher laser fluences nonlinear ion acceleration is
demonstrated by direct time-of-flight measurements.
Publisher
Springer Science and Business Media LLC
Cited by
6 articles.
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