Author:
Furuya Kazuo,Piao Min,Ishikawa Nobuhiro,Saito Tetsuya
Abstract
AbstractDefect clusters in Al during electron and ion irradiation have been investigated using highresolution transmission electron microscopy (HRTEM). An ION/HVEM system which consists of a high-voltage TEM and ion implanters was used for in-situ observation of damage evolution under 1000 keV electrons and 15 keV He+ irradiation at room temperature. HRTEM of Al in [110] orientation showed many planar defects along { 111 } planes during electron irradiation, while a high density of small polyhedron-shaped cavities (He-bubbles) was observed in addition to the planar defects after He+ irradiation. Multi-slice image simulation of various models of dislocation loops indicated the planar defect as an interstitial-type Frank loop.
Publisher
Springer Science and Business Media LLC
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design of a beam line for simultaneous dual-beam ion implantation;AIP Advances;2023-07-01
2. New Microscope and Ion Accelerators for Materials Investigations (MIAMI-2) system at the University of Huddersfield;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2019-07
3. Transmission electron microscopy with in situ ion irradiation;Journal of Materials Research;2015-02-10
4. A review of transmission electron microscopes with in situ ion irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-12
5. Radiation damage during HRTEM studies in pure Al and Al alloys;International Journal of Materials Research;2006-07-01