Author:
Cho N.-H.,Krishnan K.M.,Veirs D.K.,Rubin M.D.,Hopper C.B.,Bhushan B.,Bogy D.B.
Abstract
AbstractThin films of diamond-like amorphous carbon were prepared by dc magnetron sputtering. A systematic variation in the physical properties of the films (mass density and electrical resistivity) was found as a function of sputtering power density. Chemical bonding and microstructure of the carbon thin films were investigated using electron energy loss spectroscopy (EELS) and Raman spectroscopy. Films grown at a lower power density were found to have more sp3 -bonded atomic sites and larger graphite microcrystals than films produced at higher sputtering power densities.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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