A study of temperature and pressure-induced structural and electronic changes in SbCl5 intercalated graphite: Part III. Analysis of the T and p dependence of the c-axis resistivity

Abstract

We present experimental data for the c-axis electrical resistivity of SbCl5 intercalated graphite between 20 and 300 K. The data are analyzed together with our previous results for these and other samples [O. E. Andersson et al., J. Mater. Res. 7, 2989 (1992)]. Before the analysis, we correct the experimental data to constant volume, as assumed by theorists. We show that the correction factor is much larger for these materials than for normal metals. Although the original data showed significant nonlinearities with T, the corrected data are linear in T to within the experimental accuracy for low-stage compounds below the intercalate crystallization temperature. We compare our results with several models and conclude that both the temperature dependence, the pressure dependence, and the relative changes in the in-plane and c-axis resistivities associated with intercalate crystallization can be best described by a band conduction model.