Post-annealing induced defects and their influences on Bi2Sr2CaCu2Oy superconducting thin films

Abstract

Defects in Bi2Sr2Can-1CunOy superconducting thin films annealed in an oxygen atmosphere are examined by high-resolution electron microscopy (HREM). In addition to the majority 2212 (n = 2) phase, subsequent slabs of other homologous phases with n values up to n = 10 are found intergrown in the films. Large-angle tilt grain boundaries and various secondary phases such as CuO, Sr-Cu-O oxides are formed in the films. The occurrence of these defects is attributed to an inhomogeneous Sr, Ca, and Cu distribution induced by the post-annealing. Superconducting transition temperature (Tc) is increased by the annealing under suitable conditions.