The Critical Stress for Transmission of a Dislocation Across an Interface: Results From Peierls and Embedded Atom Models-Reference-Cited by-同舟云学术

The Critical Stress for Transmission of a Dislocation Across an Interface: Results From Peierls and Embedded Atom Models

Published:1999 Issue: Volume:586 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Anderson P. M.,Rao S.,Cheng Y.,Hazzledine P. M.

Abstract

ABSTRACTA continuum Peierls model of a screw dislocation being pushed through an interface and an atomistic EAM study of dislocation transmission across a [0 0 1] Al-Ni interface suggest that core spreading into the interface and misfit dislocations in the interface are both potent effects that can significantly increase barrier strength of interfaces.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference25 articles.

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