Low temperature phase separation in CeSi1.86

Abstract

Samples of CeSi1.86 which exhibit Kondo behavior are shown by neutron powder diffraction and transmission electron microscopy to consist of two closely related tetragonal phases. The primary phase is of the ThSi2 structure type with some vacancies in the silicon sublattice. The second phase presents an ordering of these vacancies. These two phases coexist at low temperature, but the abundance of the second phase increases with decreasing temperature. Neutron diffraction measurements and TEM experiments show that the phase separation occurs reversibly around 260 K, in close relation with an anomaly in the transport properties. The presence of a hysteresis indicates that we are dealing with a first order transition.