Silicon Carbide bipolar power devices - potentials and limits

Author:

Singh Ranbir

Abstract

ABSTRACTBipolar devices made with SiC offer 20–50X lower switching losses as compared to conventional semiconductors, and a comparable on-state voltage drop at sufficiently high current densities. To exploit the tremendous advantages offered by SiC for bipolar power devices, it is important to understand the relevant voltage/current range, fundamental limits and technological challenges in order to develop this technology commercially. The opportunity of operating a device at a high current density (>300 A/cm2) to increase total current with reasonable yield, the poor reliability of MOS at high temperatures, and the relatively low channel mobilities obtained in 4H-SiC MOSFETs may make certain bipolar devices more attractive even as low as 1700 V. The total power loss in various bipolar devices is analyzed and compared to fundamental operational limits in order to find the applicability of various devices to advanced applications.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference11 articles.

1. [10] Singh R. , Irvine K. G. and Palmour J. W. , “4H-SiC buried gate Field Control Thyristor”, Proc. 55th Device Research Conference, pp. 34–35, June 23–25, 1997. Ft. Collins, USA.

2. Processes at turn-on of thyristors

3. [8] Singh R. and Palmour J. W. , ”High Temperature characteristics of 8.6 kV 4H-SiC PiN Diode”, Proc. High temperature Electronics Conference (to be published), presented at HiTEC 2000, June 13–15 2000 Albuquerque, USA.

4. [3] Baliga B.J. , Power Semiconductor Devices, PWS Publishing Co, 1996.

5. [7] Lendenmann H. and Fichtner W. , ”Turn-Off failure mechanisms in large MCT devices”, Proc. Int. Symp. Pwr. Semicond. Dev. & ICs (ISPSD '94), pp. 207–212, 1994.

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1. Reliability and performance limitations in SiC power devices;Microelectronics Reliability;2006-05

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