Abstract
ABSTRACTIt has been known for some time that the velocity of dislocations in semiconductors depends strongly on the concentration of electrically active impurities. Various explanations based on different models of the electronic structure of the dislocations have been proposed; they involve the dependence of the formation energy and/or activation energy of migration of dislocation kinks on the Fermi level. A review will be presented of these theories and of recent structural models of dislocation cores and kinks.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献