Author:
Ramamurthy Sundar,Mallamaci Michael P.,Barry Carter C.
Abstract
ABSTRACTThin, calcium magnesium silicate glass films have been deposited onto (001) -oriented single-crystal MgO substrates by pulsed-laser deposition (PLD). The substrates were thinned to electron transparency and characterized in the transmission electron Microscope (TEM) before and after the deposition and following different heat treatments. Energy Dispersive X-ray Spectroscopy (EDS) was used in the TEM to characterize the chemistry of the films. The heat treatments were performed both in situ and ex situ. Direct evidence for crystallization was obtained by in-situ experiments at 950°C. Subsequent heat treatments were performed for longer times in air between 950°C and 1100°C. The crystallized phase was found to be Monticellite (CaMgSiO4) and the crystallites show moderate epitaxy with the underlying substrate. Films contaminated with aluminum resulted in the growth of magnesium aluminate spinel (MgAl2O4) epitaxially from the substrate. These observations of epitaxy indicated that crystallization initiated at the surface of MgO.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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