Dependence of the strength of van der Waals interactions on the details of the dielectric response variation

Author:

Hopkins Jaime C.,Dryden Daniel M.,Ching Wai-Yim,French Roger H.,Parsegian V. Adrian,Podgornik Rudolf

Abstract

ABSTRACTWe will present a simplified approximate model showing how even small changes in the dielectric response result in substantial variations in the Hamaker coefficient of the van der Waals interactions. Since all the terms in the Matsubara summation depends on the variation of the dielectric response spectra at one particular frequency, the total change in the Hamaker coefficient depends on the spectral changes not only at that frequency but also at the rest of the spectrum properly weighted. The Matsubara terms most affected by the addition of a single peak are not those close to the position of the added peak, but are distributed over the entire range of frequencies. We comment on the possibility of eliminating van der Waals interactions and/or drastically reducing them by spectral variation in a narrow regime of frequencies.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3