InGaN structure influence on efficiency droop

Author:

Rabinovich Oleg

Abstract

ABSTRACTSimulation results of InGaN light-emitting diodes and efficiency droop are presented. A special method for investigating the changes in the semiconductor devices characteristics due to different influencing factors is developed.The cause of efficiency droop was detected-large difference in carrier lifetimes. The simulation results are used to suggest several techniques for improving LED efficiency up to 10-15 %.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference6 articles.

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2. 2. Rabinovich O.I. , “Electrical and optical AlGaInN light emitting diodes characteristics simulation”. The thesis for the Doctor of Philosophy degree. College of New Materials and Nanotechnology. National University of Science and Technology «Moscow Institute of Steel and Alloys», (2008).

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4. Physical simulation of optoelectronic semiconductor devices;Winston;Department of Electrical and Computer Engineering of the University of Colorado,1996

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