Surface Chemistry of Porous Silicon

Author:

Chazalviel J.-N.,Ozanam F.

Abstract

AbstractAs-prepared porous silicon comes out covered with covalently bonded hydrogen. This hydrogen coating provides a good electronic passivation of the surface, but it exhibits limited stability, being removed by thermal desorption or converted into an oxide upon prolonged storage in air. Starting from the hydrogenated surface, an oxide layer with good electronic properties is also obtained by anodic oxidation or rapid thermal oxidation.The hydrogenated surface may be nitridized using thermal treatments in nitrogen or ammonia. Fast halogenation of the surface may be obtained at room temperature, but the resulting coating is rapidly converted to an oxide in the presence of moisture. Many metals have been incorporated into the pores, using chemical or vacuum techniques, or even direct incorporation during porous silicon formation.More interestingly, organic derivatization may increase surface stability or provide chemical functionalities. The poor reactivity of the hydrogenated surface can be remedied by using various methods: thermal desorption of hydrogen, hydroxylation or halogenation of the surface, thermal or UV assisted reaction. However, most promising results have been obtained through either Lewis-acid catalyzed grafting or electrochemical activation of the surface. The latter method has been used for grafting formate, alkoxy, and recently methyl groups. In most of these methods, oxidation is present as a parallel path, and care must be taken if it is not desired. Also, 100% substitution of the hydrogens by organic groups has never been attained, due to steric hindrance problems. The electrochemical method appears especially fast, and has led to 80% substitution of the hydrogens by methyl groups, with no photoluminescence loss and a chemical stability increased by one order of magnitude.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 25 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3