In-Plane Anisotropy In CoCr(Ta,Pt)/Cr Films Deposited onto Substrates with Controlled Topography-Reference-Cited by-同舟云学术

In-Plane Anisotropy In CoCr(Ta,Pt)/Cr Films Deposited onto Substrates with Controlled Topography

Published:1998-01 Issue: Volume:517 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Twisselmann D.J.,Adekor B.T.,Farhoud M.,Smith Henry I.,Dorsey P.C.,Ross C.A.

Abstract

AbstractIn-plane magnetic anisotropy can be induced in Cr-underlayer/Co-alloy thin films by grooves or scratches in the substrate. To quantify this effect, silica substrates have been prepared with large areas of submicron grooves using interferometric lithography. The growth of Cr films and Cr/Co-alloy bilayer films on these substrates has been investigated, and in-plane magnetic anisotropy has been observed.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

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