Author:
Hsieh G.,Edwards D. D.,Ford S. J.,Hwang J.-H.,Shane J.,Garboczi E. J.,Mason T. O.
Abstract
ABSTRACTUsing resistor-capacitor networks, sources of experimental artifacts in impedance spectroscopy were investigated, such sources include machine limitations, rig/cabling contributions at high frequencies, and artifacts due to high impedance reference electrodes and their geometrical placement. In the instance of electrode placement, computer simulations with a pixel-based model were in agreement with the experimental observations. Remedies for these artifacts such as rig shielding/grounding, geometrical adjustments, and null corrections are also discussed.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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1. Conductivity spectroscopy;Current Opinion in Solid State and Materials Science;1997-08