Author:
Rodmacq B.,Hillairet J.,Laugier J.,Chamberod A.
Abstract
AbstractX-ray diffraction, electrical resistivity and dimensional variation measurements have been performed in order to characterise the structural and transport properties of Fe/Ti multilayers both in the as-prepared state and during thermal annealing. For small periods, the multilayers consist of hep Ti and amorphous iron-rich layers. Increasing the period leads to the crystallisation of the Fe-rich layers, which correlates with a sudden decrease of the electrical resistivity. Depending on the period (that is on the initial structure of the layers), very different types of evolution are observed upon annealing, corresponding to either interdiffusion or preferential diffusion of one of the species.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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