Modeling evaporation, ion-beam assist, and magnetron sputtering of TiO2 thin films over realistic timescales-Reference-Cited by-同舟云学术

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Modeling evaporation, ion-beam assist, and magnetron sputtering of TiO2 thin films over realistic timescales

Published:2011-12-01 Issue:5 Volume:27 Page:799-805
ISSN:0884-2914
Container-title:Journal of Materials Research
language:en
Short-container-title:J. Mater. Res.

Author:

Blackwell Sabrina,Smith Roger,Kenny Steven D.,Vernon Louis J.,Walls John M.

Abstract

Abstract

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference32 articles.

1. Charge equilibration for molecular dynamics simulations

2. Growth of TiO2 surfaces following low energy (<40eV) atom and small cluster bombardment

3. A comparison of vacuum-evaporated and ion-plated thin films using Auger electron spectroscopy

4. A climbing image nudged elastic band method for finding saddle points and minimum energy paths

5. 26. Vernon L.J. : Modelling the Growth of TiO2 . PhD thesis, Loughborough University, (2010).

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2. Determination of thin metal film’s thickness and optical constants based on SPR phase detection by simulated annealing particle swarm optimization;Optics Communications;2019-01

3. Reaction pathways in atomistic models of thin film growth;The Journal of Chemical Physics;2017-10-21

4. Modelling the growth of ZnO thin films by PVD methods and the effects of post-annealing;Journal of Physics: Condensed Matter;2013-03-01

5. Modeling evaporation, ion-beam assist, and magnetron sputtering of thin metal films over realistic time scales;Physical Review B;2012-07-11

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