Author:
Manara A.,Lanza F.,Della Mea G.,Rossi C.,Salvagno G.
Abstract
ABSTRACTSurface analysis has been conducted on samples leached in a Sochlet apparatus at 100°C in the presence and in the absence of air. The XPS technique was applied to analyse the content of iron and silicon while the nuclear reaction method was utilized to analyse the content of hydrogen. Samples leached in argon atmosphere have shown a smaller content of iron and silicon with respect to the samples leached in air atmosphere. The H concentration has shown the same behaviour. The results are discussed in terms of possible formation of iron compounds in the different redox condition and of their different stabilities and in terms of their efficiency in reducing exchange between Na+ and H+ ions.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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