Time Decay Characteristics of the Yb3+- Related 0.98 μm Emissions in Porous Silicon

Abstract

AbstractEnhanced emissions at 0.98 μm of Yb3+ ions (2F5/2 → 2F7/2) incorporated in porous silicon are obtained when the host porous silicon is pre-annealed in an O2 containing atmosphere. Time decay characteristics are measured for the Yb 3+-related 0.98 μm emissions as well as for the emissions of these host porous silicon between 20 K and 300 K. The decay of the Yb3+ peak at 20 K is characterized with a fast (˜ 30 μs) and a slow decay time (≤ ˜ 400 μs), whereas it is fitted with one slow decay time (˜ 390 μs) at 300 K. The results are explained in terms of two optical centers: one has a fast fluorescent lifetime with a large temperature quenching, and the other has a slow fluorescent lifetime which is nearly constant between 20 K and 300 K.