The Application of Thick Hydrogenated Amorphous Silicon Layers to Charged Particle and X-Ray Detection

Abstract

ABSTRACTWe outline the characteristics of thick hydrogdenated amorphous silicon layers which are optimized for the detection of charged particles, x-rays and γ-rays. Signal amplitude as a function of the linear energy transfer of various particles are given. Noise sources generated by the detector material and by the thin film electronics - a-Si:H or polysilicon proposed for pixel position sensitive detectors readout are described, and their relative amplitudes are calculated. Temperature and neutron radiation effects on leakage currents and the corresponding noise changes are presented.