Concentration Measurements and Depth Profiling of Phosphorus and Boron by Means of (p,γ) Resonant Reactions

Abstract

ABSTRACTSmall concentrations of phosphorus and boron in thin films have been measured by detection of proton induced prompt γ-rays. This technique is almost free of interference from other elements in the film or the substrate. Furthermore it is possible to obtain depth information without sputtering. The detection limit of both elements is around 100 ppm; depth resolution at shallow depths in silicon is about 50 nm in the case of boron, whereas it is better than 10 nm in the case of phosphorus.As an application of this method, the incorporation of phosphorus and boron in thin films of hydrogenated amorphous silicon is measured. The films were prepared in a glow discharge reactor by mixing PH3 or B2H6 with the SiH4/H2 gas mixture.