Dynamics of Ga Clusters on GaAs(001) Surface

Author:

Tsukamoto Shiro,Koguchi Nobuyuki

Abstract

AbstractDynamics of Ga clusters and GaAs epitaxial growth on a GaAs (001) surface were successfully observed by a system in which scanning tunneling microscopy (STM) and molecular beam epitaxy (MBE) were incorporated into one unit rather than in separate chambers. With the substrate temperature of 528°C, reflection high-energy diffraction (RHEED) patterns showed a (4×6) Ga-stabilized surface reconstruction and dynamics of steps and islands were clearly observed. The detaching and attaching of small Ga clusters might cause the change of steps and islands. It seems that the small Ga clusters migrated with the diameter of about 0.8 to 1.2 nm and around the steps and islands. These clusters could be observed only when they were detached from or attached to the steps and islands. Moreover, even under the substrate temperature of 440 oC and the As4 partial pressure of 2×10−6 torr, STM images were clearly observed. After 0.1 ML Ga was additionally supplied to the sample by migration enhanced epitaxy mode, step flow growth occurred, resulting in an additional GaAs layer grown on the B-step side. Moreover, the c(4×4) As-stabilized surface reconstruction was moderate. It seems that there is an equilibrium additional layer of As amorphous adatoms on the c(4x4) surface reconstructions.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Molecular beam epitaxy;Molecular Beam Epitaxy;2013

2. GaSb/GaAs Quantum Nanostructures by Molecular Beam Epitaxy;Handbook of Self Assembled Semiconductor Nanostructures for Novel Devices in Photonics and Electronics;2008

3. In-situ STM Studies on III-V Compound Semiconductor Surfaces during MBE Growth;Hyomen Kagaku;2008

4. In situ study of low-temperature growth and Mn, Si, Sn doping of GaAs () in molecular beam epitaxy;Journal of Crystal Growth;2004-05

5. Ga-rich GaAs(001) surfaces observed by STM during high-temperature annealing in MBE;Journal of Crystal Growth;2003-04

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