Author:
Saranin Alexander A.,Rizhkov Sergey V.,Tsukanov Dmitriy A.,Lifshits Victor G.,Zotov Andrey V.,Oura Kenjiro,Hasegawa Shuji
Abstract
AbstractTo study structural and transport properties of the surface phases on silicon, a number of adsorbate/silicon systems on Si(100) and Si(111) surfaces has been investigated using scanning tunneling microscopy (STM), reflection-high-energy-electron diffraction (RHEED) and in-situ electrical resistance measurements. Results of investigations of formation and electrical properties of Si-Al, Si-Na, Si-Ag and Si-In surface structure are presented.
Publisher
Springer Science and Business Media LLC