Author:
Barabash R.I.,Ice G.E.,Walker F.J.
Abstract
AbstractBrilliant synchrotron microprobes offer new opportunities for the analysis of stress/strain and deformation distributions in crystalline materials. Polychromatic x-ray microdiffraction is emerging as a particularly important tool because it allows for local crystal-structure measurements in highly deformed or polycrystalline materials where sample rotations complicate alternative methods; a complete Laue pattern is generated in each volume element intercepted by the probe beam. Although a straightforward approach to the measurement of stress/strain fields through white-beam Laue microdiffraction has been demonstrated, a comparable method for determining the plastic-deformation tensor has not been established. Here we report on modeling efforts that can guide automated fitting of plastic-deformation-tensor distributions in three dimensions.
Publisher
Springer Science and Business Media LLC
Reference21 articles.
1. . The submitted manuscript has been authored by a contractor of the U.S. Government under contract No. DE-AC05-00OR22725. Accordingly, the U.S. Government retains a nonexclusive, royalty-free license to publish or reproduce the published or reproduce the published form of this contribution, or allow others to do so, for U.S. Government purposes
2. X-Ray Microbeam Measurement of Local Texture and Strain in Metals
3. Microbeam-forming methods for synchrotron radiation
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