Author:
Islam A. T. M. Nazmul,Ashizawa K.,Watauchi S.,Tanaka I.
Abstract
ABSTRACTWe have grown La2−xSrxCuO4 single-crystalline films on atetra-axis oriented Zn doped La2CuO4 single crystals by IR-LPE technique. The films show thickness dependence of Tc,onset, but films of thickness below 80μm doesn't show zero resistance down to 4.2K. The I-V characteristics showed reduced voltage jump than usual and small hysteresis. This phenomenon resembles with the characteristics of resistively and capacitively shunted intrinsic Josephson junctions (RCSJ)
Publisher
Springer Science and Business Media LLC