Author:
van der Kuur Jan,Korevaar Bas,Pols Martin,van der Linden Jacqueline,Thijsse Barend
Abstract
ABSTRACTArgon incorporation and defect creation were studied experimentally. Direct desorption measurements have been used to establish the argon implantation profile. A projected range and range straggle of 0.8 and 3.5 Å were found. Argon is incorporated at substitutional positions. The creation rate of defects by argon was studied by helium desorption spectrometry. A net creation rate of (0.7 ± 0.4) × 10−3 vacancy/argon atom was found. Ion assisted deposition at elevated substrate temperatures shows that all incorporated argon acts as helium trap. Argon fluence variations show an effective cross-section for self sputtering of 31 Å2, a trapping probability of 6.5%, and a maximum achievable argon concentration of 4 × 10−3
Publisher
Springer Science and Business Media LLC
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献