Author:
Mroczkowski J. A.,Lesondak E.,Resler D.
Abstract
ABSTRACTThe frequency response in the modulation of the excess electron concentration, produced by a modulated photogenerating pump beam, is used to determine bulk life-time and the surface or interface recombination velocity. The depth-wise integrated excess electron concentration is contactlessly monitored by the proportional absorption/ transmission modulation of a second probe beam. Using this approach over the 20 kHz to 3 MHz frequency range recombination velocities up to 104 cm/sec have been measured in n-type epitaxial HgCdTe films.
Publisher
Springer Science and Business Media LLC
Reference5 articles.
1. 4. Mroczkowski J.A. , “HgCdTe Materials Screening Test Station”, U.S. Army CECOM Report No. DAAK70-83-C-0184, 1986.
2. Photoabsorptance and electron lifetime measurement in HgCdTe
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2 articles.
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