Author:
Lubianiker Yoram,Cohen J. David,Jin Hyun-Chul,Abelson John R.
Abstract
ABSTRACTWe have studied the degradation kinetics of undoped a-Si:H films which contain a significant fraction of silicon microcrystallites. The degradation rate is found to be exceptionally slow in the first stage of degradation, then the defect density follows the “normal” t1/3rate and finally saturates. We present a model which relates this abnormal kinetics to the microcrystallites which are embedded in the amorphous matrix.
Publisher
Springer Science and Business Media LLC