Author:
Golikova O.A.,Kazanin M.M.,Kudoyarova V.Kh.,Adriaenssens G.J.,Eliat A.
Abstract
ABSTRACTA study of a-Si:H structure on the scales of short- and medium- range order has been carried out by the Raman spectroscopy method. Undoped a-Si:H films were deposited by the conventional rf- PECVD with some special variations in the process conditions ( pseudodoping technique); doping with boron was performed from a gas phase as well as by ion implantation. Changes in short- and medium- range order induced by light-soaking, pseudodoping and doping with boron were determined and compared.
Publisher
Springer Science and Business Media LLC
Cited by
3 articles.
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