Author:
Crandall R. S.,Iwaniczko E.,Mahan A. H.,Liu X.,Pohl R.O.
Abstract
ABSTRACTWe present internal friction and shear modulus measurements of amorphous silicon (a-Si) and germanium (a-Ge) films. The temperature independent plateau in internal friction below 10 K, common to all amorphous solids, also exists in these films. However, its magnitude which depends critically on the deposition method is smaller than found for all other amorphous solids. In particular, hydrogenated a-Si with about 1 at. % H prepared by hot-wire chemical-vapor-deposition leads to an internal friction nearly three orders of magnitude smaller than observed for all other amorphous solids. The internal friction increases after the hydrogen is removed by effusion.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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