Structural Analyses and Magnetic Properties of Multiple-Structure Multilayered Co/Au Films

Abstract

AbstractIn the interfaces of multilayered Co/Au and Co/Pd films, there were some interesting changes with annealing. For profile fittings, which is a comparison between measured peaks of X-ray diffraction and calculated peaks of the extended 3-step model profile fittings, the mixed layers between Co layers and noble metal layers were decreased in Co/Au films while increased in Co/Pd films. These results are based on the difference that Co-Au is a eutectic system while Co-Pd is an isomorphous system. This time, as new research, we fabricated multiple-structure multilayered Co/Au films (MSM Co/Au films). Magnetic properties and structural analyses were carried out with a vibrating sample magnetometer (VSM), X-ray diffraction (XRD), and extended 3-step model profile fittings. MSM Co/Au films have two periodic thicknesses. MSM Co/Au films showed the same perpendicular magnetization as Co/Au and Co/Pd films, which is dependent on the Co layer thickness. Perpendicular magnetization showed the maximum value after 1 h-annealing at 473 K. It was well confirmed that the mixed layers decreased at this annealing condition with the extended 3-step model profile fittings.