Author:
Brow R. K.,Saha S. K.,Goldstein J. I.
Abstract
AbstractInterfacial reactions between the melts of several borate glasses and titanium have been investigated by analytical scanning electron microscopy (ASEM) and by x-ray photoelectron spectroscopy (XPS). A thin titanium boride interfacial layer is detected by XPS after short (30 minutes) thermal treatments. ASEM analyses after longer thermal treatments (8–120 hours) reveal boron-rich interfacial layers and boride precipitates in the Ti side of the interface.
Publisher
Springer Science and Business Media LLC
Cited by
13 articles.
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