Author:
Bowman R. C.,Adams P. M.,Herman M. H.,Buttrill S. E.
Abstract
ABSTRACTRaman scattering, double-crystal x-ray diffraction, and electron beam electroreflectance have been used to assess the damage produced in undoped (100)-GaAs by boron ion implants and the influence of post-implant anneals. Both conventional furnace and rapid thermal annealing treatments were found to remove much of the lattice strain created by the implants. However, considerable disorder also remains after these anneals.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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