Author:
Clolus E.,Galtayries A.,Canava B.,Guillemoles J. F.,Lincot D.
Abstract
ABSTRACTState of the art CIGS thin films have been studied by means of the semiconductorelectrolyte junction. They appear as chemically robust allowing to use aggressive electrolyte compositions as for instance more acidic pH, down to 0 in sulfuric acid environment. In these electrolytes, reliable capacitance and photo-current related characterization techniques have been used. It has been shown that a short treatment in a gold (III) solution can facilitate the characterizations, and stabilize the surface composition. These results tend towards settling a standardized electrochemical testing procedure for CIGS layers
Publisher
Springer Science and Business Media LLC
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