Author:
Sanyal M. K.,Sinha S. K.,Gibaud A.,Satija S. K.,Majkrzak C. F.,Homma H.
Abstract
AbstractThe results of specular and diffuse x-ray scattering studies of multilayers are discussed. We show here that such studies can yield detailed statistical information about the interfacial roughness and morphology. Results on a GaAs/AlAs multilayer are presented and the data is analyzed within the Born approximation.
Publisher
Springer Science and Business Media LLC
Reference3 articles.
1. X-ray-scattering study of capillary-wave fluctuations at a liquid surface
2. X-ray and neutron scattering from rough surfaces
3. 3. Sinha S.K. , Sanyal M.K. , Gibaud A. , Satija S.K. , Majkrzak C.F. , and Homma H. , presented at the NATO Advanced Study Institute Conference, Crete, Greece, 1990 (unpublished).
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献