Author:
Morimoto Akiharu,Otsubo Shigeru,Shimizu Tatsuo,Minamikawa Toshiharu,Yonezawa Yasuto,Kidoh Hideo,Ogawa Toshio
Abstract
ABSTRACTPb(Zr0.52Ti0. 48)O3 (PZT) films were prepared on r-plane sapphire substrates by the laser ablation method utilizing ArF excimer laser in O2 or N2O environment. The composition of the films deposited in O2 environment was found to be fairly close to the composition of the target material for a wide range of substrate temperatures, 400 – 750 °c. Increasing the laser fluence (the laser power density) for the ablation enhances the formation of the perovskite structure rather than the pyrochlore one. Use of N2O ambient gas instead of O2 gas enhances the formation of the perovskite structure of PZT films. Furthermore, it was found that a laser irradiation on the growing film surface during deposition enhances the formation of the perovskite structure.
Publisher
Springer Science and Business Media LLC
Cited by
22 articles.
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