Author:
Godbole V. P.,Vispute R. D.,Chaudhari S. M.,Kanetkar S. M.,Ogale S. B.
Abstract
In this paper we report the influence of process variables, viz., substrate temperature, oxygen partial pressure, and external electric field bias, on phase precipitation and microstructure of tin oxide films as revealed by small-angle x-ray diffraction and conversion electron Mössbauer spectroscopy.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
37 articles.
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