A Study of Intermetallic Compound Development In Nickel-Tin Interfacial Zones

Author:

Allen Charles W.,Fulcher Mark R.,Rai Amarjit S.,Sargent Gordon A.,Miller Albert E.

Abstract

AbstractInterdiffusion and intermetallic formation in Ni-Sn interfacial zones are examined by X-ray diffraction in samples prepared by electroplating of Sn at room temperature. For the case of plating directly onto electropolished nickel, only very sluggish formation of Ni3Sn4 was observed at 190 C. In contrast, when the nickel surface is chemicaly or chemically-abrasively activated prior to plating, a thin layer of Ni3Sn forms at the initial interface at room temperature, and subsequent annealing at 100 and 190 C produces all intermetallics predicted by the equilibrium phase diagram including Ni3Sn, indicating that the absence of Ni3Sn usually observed arises from its failure to nucleate.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Reliability study of the electroless Ni–P layer against solder alloy;Microelectronics Reliability;2002-07

2. Package-to-Board Interconnections;Microelectronics Packaging Handbook;1997

3. Temperature cycling effects between Sn/Pb solder and electroless copper plated AIN substrate;Journal of Materials Science: Materials in Electronics;1995-12

4. Formation Kinetics and Thin Film Stress of Tin Containing Intermetallic Compounds;MRS Proceedings;1992

5. Package-to-Board Interconnections;Microelectronics Packaging Handbook;1989

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