Vector E-Field Probe for Testing Industrial Applicators.
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Published:1994
Issue:
Volume:347
Page:
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ISSN:0272-9172
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Container-title:MRS Proceedings
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language:en
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Short-container-title:MRS Proc.
Author:
Roussy Georges,Thiebaut Jean-Marie,Agbossou Kodjo,Dichtel Bernard
Abstract
ABSTRACTUsing the modulated scatterer technique allows us to measure the electromagnetic field in an applicator. The design of a new sensor modulated at 25 Hz is described. The operating conditions and the performance are presented.The sensor can be used for measuring high microwave electric fields up to 10 kV/m in an industrial applicator supplied by any industrial magnetron.
Publisher
Springer Science and Business Media LLC
Subject
General Engineering
Reference13 articles.
1. [11] Roussy G. , Dichtel B. and Agbossou K. , French Patent No 91 13194 ( 25 October 1991).