Proton irradiation-induced blistering in UO2

Abstract

AbstractProton (H+) irradiation effects in polycrystalline UO2 have been studied. The irradiation was carried out using three ion energies and two different ion fluxes at 600 °C. Scanning electron microscopy (SEM) investigations showed that significant surface flaking took place. Focused ion beam (FIB) milling in SEM was successfully applied for extracting lamellas from uneven blistered surfaces for transmission electron microscopy (TEM) investigations allowing detailed investigations for the degradation mechanisms. High-resolution TEM for the flaked UO2 surfaces revealed that the implanted H+ formed sharp two-dimensional cavities at the peak ion-stopping region instead of diffusing to the matrix. The resulting lateral stress likely caused UO2 surface deterioration in good agreement with previous blistering and flaking studies on crystalline materials. Graphical abstract