Characterization of VO2 thin films deposited by simple and sustainable spray technique-Reference-Cited by-同舟云学术

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Characterization of VO2 thin films deposited by simple and sustainable spray technique

Published:2023-12-12 Issue:24 Volume:8 Page:1413-1418
ISSN:2059-8521
Container-title:MRS Advances
language:en
Short-container-title:MRS Advances

Author:

Figueroa-Torres M. Z.^ORCID,Ruíz-Gómez M. A.^ORCID,González-López J. R.^ORCID,Zaldívar-Cadena A. A.^ORCID,Cruz-López A.^ORCID,Mendoza-Jiménez J. A.^ORCID

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://link.springer.com/content/pdf/10.1557/s43580-023-00738-4.pdf

Reference19 articles.

1. M. Kumar, J.P. Singh, K.H. Chae, J. Park, H.H. Lee, Superl. Microstruct (2020). https://doi.org/10.1016/j.spmi.2019.106335

2. Y. Long, Y. Cui, Y. Ke, C. Liu, Z. Chen, N. Wang, L. Zhang, Y. Zhou, S. Wang, Y. Gao, Joule. (2018). https://doi.org/10.1016/j.joule.2018.06.018

3. J.B. Kim, D. Lee, I.H. Yeo, H.Y. Woo, D.W. Kim, J.Y. Chae, D.W. Lee, S.H. Han, T. Paik, Sol. Energy Maters. Sol. C. (2021). https://doi.org/10.1016/j.solmat.2021.111055

4. N. Wang, S. Liu, X.T. Zeng, S. Magdassi, Y. Long, J. Mater. Chem. C. Mater. (2015). https://doi.org/10.1039/c5tc01062d

5. M.K. Dietrich, B.G. Kramm, M. Becker, B.K. Meyer, A. Polity, P.J. Klar, J. Appl. Phys. (2015). https://doi.org/10.1063/1.4919433

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