Nanomechanical Probing of Layered Nanoscale Polymer Films With Atomic Force Microscopy

Abstract

The approach developed for the microindentation of layered elastic solids was adapted to analyze atomic force microscopy probing of ultrathin (1–100 nm-thick) polymer films on a solid substrate. The model for analyzing microindentation of layered solids was extended to construct two- and tri-step graded functions with the transition zones accounting for a variable gradient between layers. This “graded” approach offered a transparent consideration of the gradient of the mechanical properties between layers. Several examples of recent applications of this model to nanoscale polymer layers were presented. We considered polymer layers with elastic moduli ranging from 0.05 to 3000 MPa with different architecture in a dry state and in a solvated state. The most sophisticated case of a tri-layered polymer film with thickness of 20–50 nm was also successfully treated within this approach. In all cases, a complex shape of corresponding loading curves and elastic modulus depth profiles obtained from experimental data were fitted by the graded functions with nanomechanical parameters (elastic moduli and transition zone widths) close to independently determined microstructural parameters (thickness and composition of layers) of the layered materials.