Author:
Robinson M. B.,Dillon A. C.,Haynes D. R.,George S. M.
Abstract
ABSTRACTTransmission Fourier Transform Infrared (FTIR) Spectroscopy was utilized to monitor the effect of surface coverage on photoluminescent porous silicon. These experiments were performed in situ in an ultrahigh vacuum (UHV) chamber to correlate simultaneously surface coverage and photoluminescence intensity. The goal of these FTIR and photoluminescence studies was to clarify the mechanism of the photoluminescence from porous silicon.
Publisher
Springer Science and Business Media LLC
Cited by
6 articles.
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