Abstract
AbstractAs a result of continuous improvement of the resist process, the experimental ion projector in the Fraunhofer Institute in Berlin (manufactured by Ion Microfabrication Systems, IMS, Vienna) has been able to print 75 nm lines and spaces into 180 nm thick standard DUV resist UV II HS without pattern collapse. A new wafer flow process for more reliable open stencil mask making was developed by IMS –Chips, Stuttgart (Germany), based on SOT wafers. Resistless direct surface modification by He and Xe ions has been tested on metallic and magnetic films in the Berlin projector. This method opens up a new possibility for the production of patterned media for future magnetic storage disks.
Publisher
Springer Science and Business Media LLC
Reference16 articles.
1. 9. Letzkus F. , Butschke J. , Hofflinger B. , Irmscher M. , Reuter C. , Springer R. , Ehrmann A. Manthuni J. , MNE-99, Microelectronic Engineering, in press
2. 14. Bruenger W.H. , Torkler M. , Terris B.D. , Rothuizen H. , Vettiger P. , Stangl G. , Fallmann W. , MNE-99, Microelectronic Engineering, in press
3. Writing and reading 7.5 Gbits/in/sup 2/ longitudinal quantized magnetic disk using magnetic force microscope tips
4. Arrays of gated field-emitter cones having 0.32 μm tip-to-tip spacing
5. Resolution improvement of ion projector with a low energy spread multicusp ion source
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