Photon Scanning Tunneling Microscopy of Optical Wavegnide Structures

Abstract

ABSTRACTPhoton scanning tunneling microscopy (PSTM) has been used to obtain effective refractive indices of optical channel waveguide structures. The local evanescent field intensity associated with the propagation modes of optical channel waveguides are measured at two different wavelengths. Both a tapered optical fiber tip and a semiconductor heterostructure tip are employed for detection. Local values of effective refractive index are measured for both TE and TM polarizations and compared to model calculations.