High Resolution Tem Applied to Nanoscale Structure Studies

Abstract

ABSTRACTIn this work, digital image processing techniques are used to study the structure of small metallic particles imaged under high resolution conditions. An algorithm is devised to extract directly from the micrographs the coordinates of columns of atoms in such a way that the crystal structure of the particles and their boundaries can be determined. For distorted regions (such as grain boundaries) the actual positions can be compared to the ones in the ideal lattice so that a general trend of the distortion field can be elucidated.