Polycrystalline Diffraction and Synchrotron Radiation

Abstract

AbstractSynchrotron radiation sources allow a new generation of parallel beam instruments to be developed for polycrystalline xray diffraction. Spectroscopy can be combined with diffraction in either angle or energy scanning modes. The high intensity narrow instrument profile and freedom from aberrations make possible a wide range of measurements; of anomalous dispersion, of peak-shape analysis to determine particle size and strain, of preferred orientation and structure as a function of depth and of lattice parameters with a precision approaching 1 part per million. The parallel beam instrument which we have developed is now to be installed on a regular basis at SSRL and at Daresbury.