Author:
Stock S. R.,Kinney J. H.,Breunig T. M.,Bonse U.,Antolovich S. D.,Johnson Q. C.,Nichols M. C.
Abstract
AbstractX-ray computed tomography (CT) uses absorption profiles from many different viewing directions to reconstruct the two-dimensional distribution of x-ray absorptivity within a slice of the sample. The tunability, high brightness and parallelism of synchrotron radiation are critical to high resolution (0.001mm), high contrast (1%) CT or microtomography. In situ study of samples multiple times during the course of an experiment is exciting to consider.Continuous fiber SiC/Al composites were deformed under three-point bending, and the resulting damage and fiber arrangement were revealed with synchrotron microtomography. Several hundred slices of 0.012 mm thickness were recorded simultaneously using 25 key radiation and a phosphor screen/charge coupled device (CCD) detector. Reconstruction was with the filtered back projection method. Low density regions were observed in the matrix in regions of highest stress where cracking is expected.
Publisher
Springer Science and Business Media LLC
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