Author:
Sakariya Kapil,Ng Clement K.M.,Huang I-Heng,Sultana Afrin,Tao Sheng,Nathan Arokia
Abstract
ABSTRACTIn this work, we have developed a method for accelerated stress testing of TFT driver circuits for AMOLED display backplane applications. Based on high current and temperature stress measurements, acceleration factors have been retrieved, which can be used to significantly reduce the testing time required to guarantee a 20000-hour display backplane lifespan.
Publisher
Springer Science and Business Media LLC
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