Abstract
AbstractCu2ZnSnS4 (CZTS) films were produced in a one-stage depositing spray pyrolysis technique instead of that needed post-sulfurization treatment. X-ray diffraction (XRD) has been used to identify crystal structure of studied films before and after E.B. irradiation. The presence of (112) as a preferred orientation indicates the kesterite phase structure of CZTS films. The energy-dispersive X-ray average data at several points of the film surface assured the homogeneous distribution of the constituent elements in the CZTS film composition. The optical behavior and the optical band-gap values of the studied CZTS films before and after E.B. irradiation have been checked by using the Tauc relation. The optical band-gap values reduced from 1.98 to 1.86 eV when the irradiation doses rose from 0 to 60 kGy. The electrochemical performance of CZTS films, on the two different conductive substrates, was tested by the cyclic voltammetry and electrochemical impedance spectroscopy analysis.
Graphical abstract
Funder
Egyptian Atomic Energy Authority
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献